Semiconductor defect inspection tool

Operators can automatically and quickly inspect semiconductor wafers from 50mm to mm at a rate of over 3, wafers per day. EagleView configures quickly without complicated and time consuming recipe development and recipe maintenance.

Contact us today to learn how Microtronic EagleView macro inspection systems can enhance your productivity. EagleView macro defect semiconductor wafer inspection systems combine state-of-the-art robotics, imaging, Microtronic ProcessGuard software, and analytics to provide an unparalleled wafer inspection solution for 50 mm to mm wafers at a rate of 3, wafers per day.

EageView systems have inspected over million wafers worldwide. Each wafer is completely imaged and stored as a full-sized wafer image at any step throughout the manufacturing process. Historical data and images are easily correlated to any point in the production process to help perform root cause analysis and take corrective action at the earliest possible time.

Semicon West Semicon Europa Semicon FMF Call Us Today! Contact Us. EagleView Automated Macro Semiconductor Wafer Defect Inspection Equipment EagleView macro defect semiconductor wafer inspection systems combine state-of-the-art robotics, imaging, Microtronic ProcessGuard software, and analytics to provide an unparalleled wafer inspection solution for 50 mm to mm wafers at a rate of 3, wafers per day.

Detects Macro Defects —Hotspots, missing patterns, spin defects, scratches, etc. No Device Dependent Recipes Required! Wafer Randomization — Eliminates separate sorter step.

Massive Sampling —inspect each and every wafer in the cassette. Root Cause Analysis Pareto graphing. Guardbanding — Electronically ink-off defects as region or die based file.

Semiconductor Defect Inspection System Market. Request TOC. Pre Book. Ask An Expert. Semiconductor Defect Inspection System Market: Introduction Semiconductor Defect Inspection System is a process of deploying the inspection equipment to validate and check for compliance or non-compliance and also deviation or improperness of the semiconductor, in terms of specific parameters.

Request Customization. Know Report Methodology. Our Clients. Company Name. Job Title. Configurable for Fabs or Failure Analysis Labs. End-User Customizable Enclosures and Layouts. Reticle Tilt Defect. Spin Defect — Line. Spin Defect — Entire Wafer. Spin Defect on Edge. Center Spin Macro Defect. Scratches By Machine. Scratches By Human. Rework — Yield Improvement. Rework — Scrap Avoidance. Previous Layer Defects. Partial Pattern — No Expose. Poly Haze Macro Defect.